PDF] ATPG for scan chain latches and flip-flops | Semantic Scholar
Dual edge sequential architecture capable of eliminating complete hold requirement from the test path
JLPEA | Free Full-Text | Aggressive Exclusion of Scan Flip-Flops from Compression Architecture for Better Coverage and Reduced TDV: A Hybrid Approach | HTML
Scan Chains: PnR Outlook
Patent Report: | US10126363 | Flip-flop circuit and scan chain using the same
Internal Scan Chain - Structured techniques in DFT (VLSI)
What is a scan insertion in DFT? - Quora
DFT scan chain 介绍_mb5fed70ede6cb4的技术博客_51CTO博客
a) Block diagram of a scan flip-flop design. (b) Scan chain. | Download Scientific Diagram